IEC 60068-2-116:2014 is an international standard that outlines the various methods for testing equipment and components under different climatic and mechanical stresses. The standard, also known as "Environmental testing - Part 2-100: Tests - Test Xb and guidance: Mould growth," provides guidelines to evaluate the resistance of products against mold growth and assess their durability in the presence of mold.
Testing methods for mold growth resistance are outlined in IEC 60068-2-103:201The main purpose of this standard is to determine how well electronic components can withstand exposure to salt mist, which is a common environmental factor in certain applications. This standard helps evaluate the performance and durability of these components, ensuring their ability to function in challenging environments.
The testing procedures for IEC 60068-2-103:2014 are designed to measure the resistance of electronic components to salt mist. The standard specifies the testing conditions, including the type of salt and the exposure time, as well as the testing equipment and procedures for collecting and analyzing the results.
In conclusion, IEC 60068-2-116:2014 is an important international standard that provides guidelines for testing the resistance of electronic components to mold growth and salt mist. The standard helps ensure that these components are able to function properly in challenging environments and are resistant to damage caused by these factors. By following the testing procedures outlined in IEC 60068-2-103:2014, manufacturers can evaluate the performance and durability of their products and ensure that they meet the necessary requirements for different applications.
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